亚洲系列日本系列精品,最新中文国产精品视频一区二区,午夜视频在线观看一区,精品国产免费人成电影在线看

<rp id="meqn6"><meter id="meqn6"></meter></rp>
<i id="meqn6"></i>
<small id="meqn6"><dl id="meqn6"></dl></small>

      • <small id="meqn6"><dl id="meqn6"><small id="meqn6"></small></dl></small>
        <i id="meqn6"></i><p id="meqn6"><ins id="meqn6"><optgroup id="meqn6"></optgroup></ins></p>
        Location:Home - Product - System Level Test Handler

        The SUMMIT-3100 Series is used to test System level IC at different temperatures ( ambient、high temperature、cold temperature). Support 6/12/16 station for parallel test sorting.

        ModelSUMMIT-3100
        Test Site Quantity6/12/16 (Base on Differenet Model)
        Temp typeAmbient&High-Temp
        UPHMax.1800(12site)
        Index TimeMin.4s
        Contact ForceMAX.120KG/site
        Rotator Function90°,180°,-90°
        Test Board Dimension6 site: Max 568mmx500m, 12 site: Max 290mmx500m, 16 site: Max 206mmx500mm
        PKG TypeQFN,QFP,BGA,LGA,PLCC,PGA, CSP,TSOP etc
        PKG SizeFrom 4x4 to 100x100 mm
        Jam Rate<1 /5000
        Tray TypeJedec tray
        Temp Range25degC to +130degC ±3degC
        Temperature accuracy±1degC
        Num Of SortingAuto Tray×4
        Multi Bin Module (Option: +Multi Bin Module)Auto Tray×2;Fix Tray×15
        Tester InterfaceRS-232,Network
        Heating Rate (Option: +ATC)Ambient~125℃ < 60s
        Cooling Rate (Option: +ATC)125~Ambient< 120s
        Heat Dissipation (Option: +ATC)200W@25℃,400W@70℃,450W@125℃(Contact size: 40 x 40mm)
        Heating Rate (Option: +Tri-temp)Ambient~125℃ < 15min
        Cooling Rate (Option: +Tri-temp)Ambient~-55℃ < 30min
        Heat Dissipation (Option: +Tri-temp)150W@-55℃,400W@25℃,400W@125℃(Contact size: 65 x 65mm)
        IC Test Equipment Provider
        Website Map Legal Statement Contact Us
        Copyright ? 2022 JHT Design Co., Ltd All Rights Reserved . Tianjin ICP No. 13001368-1 .